发明名称 INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE
摘要 An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and communicate force and sense signals to a tester, allowing a measure of the chip's actual resistance.
申请公布号 PH12016501480(A1) 申请公布日期 2016.08.22
申请号 PH12016501480 申请日期 2016.07.27
申请人 XCERRA CORPORATION 发明人 TIENGTUM, PONGSAK;LANDA, VICTOR
分类号 G01R1/04;H01L21/66;H01R13/24 主分类号 G01R1/04
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