发明名称 |
INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE |
摘要 |
An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and communicate force and sense signals to a tester, allowing a measure of the chip's actual resistance. |
申请公布号 |
PH12016501480(A1) |
申请公布日期 |
2016.08.22 |
申请号 |
PH12016501480 |
申请日期 |
2016.07.27 |
申请人 |
XCERRA CORPORATION |
发明人 |
TIENGTUM, PONGSAK;LANDA, VICTOR |
分类号 |
G01R1/04;H01L21/66;H01R13/24 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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