| 发明名称 | Electro-optical device and electronic apparatus | ||
| 摘要 | An electro-optical device including a substrate; an array region which is formed on the substrate and in which a plurality of light emitting pixels are arranged two-dimensionally; first drive lines that are arranged in a row direction and are connected to each of the light emitting pixels; second drive lines that are arranged in a column direction and are connected to each of the light emitting pixels; a drive circuit that supplies a drive signal to at least one of the first drive line and the second drive line; an inspection terminal that is electrically connected to the drive circuit or the second drive lines; and an electrostatic protection circuit that is connected to the inspection terminal, in which at least a part of the electrostatic protection circuit overlaps the inspection terminal in a plan view. | ||
| 申请公布号 | US9437140(B2) | 申请公布日期 | 2016.09.06 |
| 申请号 | US201514593252 | 申请日期 | 2015.01.09 |
| 申请人 | SEIKO EPSON CORPORATION | 发明人 | Ota Hitoshi;Iwasaki Masanori;Takahashi Makiko |
| 分类号 | G09G3/32 | 主分类号 | G09G3/32 |
| 代理机构 | Oliff PLC | 代理人 | Oliff PLC |
| 主权项 | 1. An electro-optical device comprising: a substrate having a rectangular shape; an array region which is formed on the substrate and in which a plurality of light emitting pixels are arranged two-dimensionally; a mounting terminal that is formed in a region different from the array region on the substrate; a first drive line connected to light emitting pixels that are arranged in a row direction; a second drive line connected to light emitting pixels that are arranged in a column direction; a drive circuit that supplies a drive signal to at least one of the first drive line and the second drive line; an inspection terminal that is electrically connected to the drive circuit or the second drive line and that is disposed on a side different from a side on which the mounting terminal of the substrate is disposed; an electrostatic protection circuit that is connected to the inspection terminal; and an insulating sealing film that covers a surface of the inspection terminal, wherein at least a part of the electrostatic protection circuit overlaps the inspection terminal in a plan view, and wherein the mounting terminal is not covered by the insulating sealing film that covers the surface of the inspection terminal. | ||
| 地址 | Tokyo JP | ||