发明名称 |
Method and apparatus for rapid measurements of electrical signals at circuit nodes of integrated circuits in which noise signals are also detected |
摘要 |
A method for measuring electrical signals according to a sampling principle with the assistance of an electron probe, whereby the signal is respectively repeatedly sampled in succession at different phase points, enables a fast registration of an electrical signal at a circuit node of an integrated circuit and simultaneously permits registration when at least one noise signal appears between two clock edges of a basic pulse rate of the integrated circuit. Between two successive phase points at which the signal is repeatedly sampled in succession for potential measurement, only a check is executed at phase points by sampling as to whether a noise signal exists in this intermediate region.
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申请公布号 |
US4721855(A) |
申请公布日期 |
1988.01.26 |
申请号 |
US19840632474 |
申请日期 |
1984.07.19 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
FAZEKAS, PETER |
分类号 |
G01R31/28;G01R31/302;G01R31/305;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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