发明名称 |
Apparatus for measuring electron temperature |
摘要 |
Apparatus for measuring the electron temperature of plasma includes a first probe which is inserted in the plasma to detect the floating potential. Two sequentially generated pulses of distinct voltages are added to the detected floating potential and these summed voltages are then sequentially applied to the plasma via a second probe. The current in the second probe is detected and the electron temperature is then calculated from the values of the voltage pulses and the currents detected by the second probe.
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申请公布号 |
US5031125(A) |
申请公布日期 |
1991.07.09 |
申请号 |
US19890334200 |
申请日期 |
1989.04.06 |
申请人 |
RIKAGAKU KENKYUSHO |
发明人 |
SHIMIZU, KAZUO;AMEMIYA, HIROSHI;SAKAMOTO, YUICHI |
分类号 |
H01J37/32;H05H1/00 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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