INSPECTING METHOD OF STATE OF CONTAMINATION OF SURFACE OF ELECTRONIC COMPONENT AFTER WASHING,申请号JP19900170041-传众专利搜索

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发明名称	INSPECTING METHOD OF STATE OF CONTAMINATION OF SURFACE OF ELECTRONIC COMPONENT AFTER WASHING
摘要
申请公布号	JPH0460457(A)	申请公布日期	1992.02.26
申请号	JP19900170041	申请日期	1990.06.29
申请人	HITACHI LTD	发明人	EZAWA MASAYOSHI;MISUMI AKIRA;KAWANAKAKO HIROSHI;KAWAGOE HIROMI;NAKAOKA YASUNAGA
分类号	G01N31/00	主分类号	G01N31/00
代理机构		代理人
主权项
地址

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