发明名称 TEMPERATURE RISE DETECTION METHOD
摘要 PROBLEM TO BE SOLVED: To eliminate the delay of detection to the generation of heat and to detect the temperature with high accuracy by deciding previously the current and resistance necessary for every action of a heating element and also a cooling term due to the time of the heating element and calculating the temperature rise value of the heating element. SOLUTION: A device 10 having a heating element 9 reads the current necessary for every action of the element 9 out of a data table 1 stored in a ROM 6, decides previously the resistance of every action of the element 9 and a cooling term due to the time of the element 9, and calculates the temperature rise value via a temperature rise value calculation part 2. In such cases, the resistance value that is varied according to the calculated current temperature rise value is read out of the table 1 for calculation of the rise temperature. Then the temperature rise value calculated at the part 2 when a power supply is cut is stored in an EEPROM 4 together with the temperature of a thermistor 5. The power cut-off time is calculated from the temperature of the thermistor 5 measured when the power supply is applied again and the cooling term. The part 2 updates the temperature rise value calculated after the power supply is applied again. As a result, the calculated temperature rise value is detected and stored with high accuracy.
申请公布号 JPH1091253(A) 申请公布日期 1998.04.10
申请号 JP19960240845 申请日期 1996.09.11
申请人 PFU LTD 发明人 MOTOKAWA HIRONAGA
分类号 B41J29/38;G05D23/00 主分类号 B41J29/38
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