DELAY TESTING METHOD AND FLIP FLOP USED FOR IT,申请号JP19970151261-传众专利搜索

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发明名称	DELAY TESTING METHOD AND FLIP FLOP USED FOR IT
摘要
申请公布号	JPH10339769(A)	申请公布日期	1998.12.22
申请号	JP19970151261	申请日期	1997.06.09
申请人	NEC CORP	发明人	YAMAUCHI TAKASHI
分类号	G01R31/28;G01R31/317;G01R31/3185;G01R31/319;(IPC1-7):G01R31/319	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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