发明名称 AMORPHOUS Ge/Te DEPOSITION PROCESS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide new processes for forming amorphous GST, GeTe, and other films in an amorphous manner, but with a relatively high deposition rate. <P>SOLUTION: Germanium, tellurium, and/or antimony precursors are usefully employed to form germanium, tellurium and/or antimony-containing films, such as films of GeTe, GST, and thermoelectric germanium-containing films. Processes for using these precursors to form amorphous films are also described. Further described is the use of [änBuC(iPrN)<SB>2</SB>}<SB>2</SB>Ge] or Ge butyl amidinate to form GeTe smooth amorphous films for phase change memory applications. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009133003(A) 申请公布日期 2009.06.18
申请号 JP20080279957 申请日期 2008.10.30
申请人 ADVANCED TECHNOLOGY MATERIALS INC 发明人 CHEN PHILIP S H;HUNKS WILLIAM;CHEN TIANNIU;STENDER MATTHIAS;XU CHONGYING;ROEDER JEFFREY F;LI WEIMIN
分类号 C23C16/30;C23C16/18;C23C16/22;H01L27/105;H01L45/00 主分类号 C23C16/30
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