| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem it is difficult to confirm whether there is a sufficient time difference between pieces of timing where the output of routes in a competitive relationship is connected to a common later-stage circuit in a normal operation test of a semiconductor integrated circuit. SOLUTION: For a testing method, the operation of the semiconductor integrated circuit 100 including first and second routes and the later-stage circuit is tested while delay larger than that in normal operation is being applied to a route where output should be connected to the later-stage circuit to which the output of the first and second routes is connected earlier in time in the first and second routes including logic circuits 10, 14. Therefore, in a normal test process, it is confirmed whether there is a sufficient time difference between pieces of timing where the output of routes in a competitive relationship is connected to the later-stage circuit. COPYRIGHT: (C)2010,JPO&INPIT
|
