发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
The inventive concepts provide semiconductor devices and methods of fabricating the same. According to the method, sub-stack structures having a predetermined height and active holes are repeatedly stacked. Thus, cell dispersion may be improved, and various errors such as a not-open error caused in an etching process may be prevented. A grain size of an active pillar used as channels may be increased or maximized using a metal induced lateral crystallization method, so that a cell current may be improved. A formation position of a metal silicide layer including a crystallization inducing metal may be controlled such that a concentration grade of the crystallization inducing metal may be controlled depending on a position within the active pillar. |
申请公布号 |
US2016225621(A1) |
申请公布日期 |
2016.08.04 |
申请号 |
US201615097369 |
申请日期 |
2016.04.13 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
SEO YuJeong;PARK JinTaek;PARK Youngwoo |
分类号 |
H01L21/02;H01L29/10;H01L29/04;H01L29/16;H01L27/115;H01L29/792 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor device, the method comprising:
forming sub-stack structures sequentially stacked on a substrate; forming an active pillar sequentially penetrating the sub-stack structures; and increasing a grain size of the active pillar by a metal induced lateral crystallization operation.
wherein increasing the grain size of the active pillar comprises: forming a metal silicide layer including a crystallization inducing metal on a top surface of the active pillar; and performing an annealing process to diffuse the crystallization inducing metal into the active pillar. |
地址 |
Suwon-si KR |