发明名称 Method and apparatus for controlling a time/temperature profile of a reflow oven
摘要 The present invention relates to controls for a multi-zone reflow oven. In the present invention a plurality of infra red thermal scanners are located at critical points along the path which a substrate passes in a reflow oven so as to generate an actual solder paste time/temperature profile as a substrate passes through the zones of the reflow oven. The actual temperature of the solder paste is determined at critical zones for generating feedback control signals. The time/temperature profile is stored for transfer to a different reflow oven so as to effect the identical solder paste time/temperature curve on the same or a different oven. Temperature deviations from the points on the solder paste time/temperature curve are calculated and control signals are generated for producing feedback signals that are applied to the controllers of the belt drive motor, the convection fan motors as well as the heating elements in the heating blocks of the vertical zone heaters to control and effect an actual and desired optimum solder paste time/temperature profile.
申请公布号 US6168064(B1) 申请公布日期 2001.01.02
申请号 US19980212746 申请日期 1998.12.16
申请人 QUAD SYSTEMS CORPORATION 发明人 BERKIN GEORGE MICHAEL
分类号 G01K1/02;B23K1/008;B23K3/04;B23K31/02;F27B9/06;F27B9/10;F27B9/24;F27B9/40;G05B19/05;H05K3/34;(IPC1-7):B23K3/04 主分类号 G01K1/02
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