发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To restrain the diffusion of metal or the like and to secure the strength of a porous insulating film to a certain degree when the porous insulating film is employed as an interlayer insulating film. SOLUTION: The porous insulating film comprising a first insulating material and having vacancies is formed on a sample substrate. A first coated film and a second coated film are formed on the surface of the porous insulating film. The first costed film is constructed by making a second insulating material invade the vacancies located in the vicinity of the surface of the porous insulating film. The second coated film is constructed using the second insulating material. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005209901(A) 申请公布日期 2005.08.04
申请号 JP20040015178 申请日期 2004.01.23
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 FURUYA AKIRA;OTSUKA NOBUYUKI;OKAMURA HIROSHI
分类号 H01L21/768;H01L21/312;H01L23/522;(IPC1-7):H01L21/312 主分类号 H01L21/768
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