发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To restrain the diffusion of metal or the like and to secure the strength of a porous insulating film to a certain degree when the porous insulating film is employed as an interlayer insulating film. SOLUTION: The porous insulating film comprising a first insulating material and having vacancies is formed on a sample substrate. A first coated film and a second coated film are formed on the surface of the porous insulating film. The first costed film is constructed by making a second insulating material invade the vacancies located in the vicinity of the surface of the porous insulating film. The second coated film is constructed using the second insulating material. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005209901(A) |
申请公布日期 |
2005.08.04 |
申请号 |
JP20040015178 |
申请日期 |
2004.01.23 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC |
发明人 |
FURUYA AKIRA;OTSUKA NOBUYUKI;OKAMURA HIROSHI |
分类号 |
H01L21/768;H01L21/312;H01L23/522;(IPC1-7):H01L21/312 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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