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发明名称
Method of correcting the critical dimension of patterns
摘要
申请公布号
KR100618847(B1)
申请公布日期
2006.09.01
申请号
KR20040056426
申请日期
2004.07.20
申请人
发明人
分类号
H01L21/027
主分类号
H01L21/027
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代理人
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