发明名称 Control circuit for semiconductor device having overheating protection function
摘要 A control circuit includes a drive circuit which applies a drive voltage to a semiconductor device having an overheating protection function according to an externally supplied signal; and a current detecting circuit which outputs a detection signal when a drive current flowing through the semiconductor device exceeds a predetermined threshold current. The semiconductor device incorporates a semiconductor element, a temperature detecting circuit for detecting temperature increase of a chip, and an interrupting circuit for interrupting an input to the semiconductor element according to a detection output of the temperature detecting circuit. The drive circuit turns off the semiconductor element and changes the drive voltage to a predetermined voltage so that the drive current exceeds the threshold current when the interrupting circuit interrupts an input to the semiconductor element, and keeps the drive voltage at the predetermined voltage while the detection signal is output from the current detecting circuit.
申请公布号 US7301129(B1) 申请公布日期 2007.11.27
申请号 US20070711822 申请日期 2007.02.28
申请人 YAZAKI CORPORATION 发明人 YABE HIROO
分类号 H05B1/02 主分类号 H05B1/02
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