| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for testing semiconductor capable of continuously using hardware without replacing it, even when a failure occurs in a storage part, and capable of reducing warranty cost. SOLUTION: In the semiconductor testing device for storing data indicating an address of a DUT (device under test) and pass/fail of an area designated by this address and testing the DUT, the storage part has an alternative area that is not used during normal testing; and this device is provided with an address-changing part for changing the address so that access to a failure area is changed to access to the alternative area, when a failure occurs in the storage part, and an address conversion part for converting the address changed by the address-changing part into a real address of the storage part. COPYRIGHT: (C)2009,JPO&INPIT
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