发明名称 Memory device having open bit line structure and method of sensing data therefrom
摘要 A memory device includes a plurality of memory blocks. Each memory block includes a plurality of bit lines, a plurality of word lines, a plurality of memory cells provided at intersections of the bit lines and word lines; a plurality of capacitors, and a plurality of sense amplifiers. Each sense amplifier has a first input and a second input. The first input is connected to a first bit line of a first one of the memory blocks and is coupled via one of the capacitors to a first bit line of a second one of the memory blocks. The second input of the input is connected to a second bit line of the second one of the memory blocks and is coupled via one of the capacitors to a second bit line of the first one of the memory blocks.
申请公布号 US7580314(B2) 申请公布日期 2009.08.25
申请号 US20070649273 申请日期 2007.01.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SU-A;SONG KI-WHAN
分类号 G11C8/00 主分类号 G11C8/00
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