发明名称 PROBE UNIT AND INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To cause two probe pins to surely probe with respect to a probing object.SOLUTION: A probe unit comprises: holding units 12a and 12b which hold each of probe pins 13a and 13b by means of respective tip ends 21a and 21b, respectively in a state where each contact side end of the probe pins 13a and 13b gets close to each other, and in which respective base ends 22a and 22b are anchored to an anchoring part 10. Each of the holding units 12a and 12b is configured to allow each of the probe pins 13a and 13b to be held so that each of the probe pins 13a and 13b are lined along a first direction B corresponding to a synthesis direction of each of running directions A1 and A2 of each of the holding parts 12a and 12b toward the respective tip ends 21a and 21b from the respective base ends 22a and 22b, and when observing each of the probe pins 13a and 13b in a first orientation toward an upstream side from a downstream side in the first direction B, each of the probe pins 13a and 13b are overlapped.SELECTED DRAWING: Figure 6
申请公布号 JP2016125933(A) 申请公布日期 2016.07.11
申请号 JP20150000793 申请日期 2015.01.06
申请人 HIOKI EE CORP 发明人 YOSHIZAWA YUTA;TOMOI TADASHI
分类号 G01R1/06;G01R1/073;H05K3/00 主分类号 G01R1/06
代理机构 代理人
主权项
地址