LASER MICROSCOPE APPARATUS

摘要

A laser microscope apparatus including: a scanning unit that scans laser light on a sample; an objective lens that collects observation light from the sample; a photo-detection unit that has a light-receiving surface formed of an array of a plurality of detecting elements capable of detecting a single photon, that receives the observation light incident on the light-receiving surface, and that outputs intensity signals having intensities corresponding to the amounts of the received observation light; an image generating unit that generates an image on the basis of the intensities of the intensity signals and scanning positions of the laser light; a processor for notifying a user when the intensity signals used to generate the image include intensity signals having intensities equal to or larger than a predetermined threshold that is set according to the beam diameter of the observation light incident on the light-receiving surface.

主权项

1. A laser microscope apparatus comprising:
a scanning unit that scans laser light on a sample; an objective lens that collects observation light produced in the sample when irradiated with the laser light; a photo-detection unit that has a light-receiving surface formed by arraying a plurality of detecting elements capable of detecting a single photon on a planar surface, that receives the observation light collected by the objective lens and incident on the light-receiving surface, and that outputs intensity signals having intensities corresponding to the amounts of the received observation light; an image generating unit that generates an image of the sample on the basis of the intensities of the intensity signals output from the photo-detection unit and scanning positions of the laser light scanned by the scanning unit; and a processor for notifying, when the intensity signals used to generate the image in the image generating unit include intensity signals having intensities equal to or larger than a predetermined threshold, a user of the existence of the intensity signals having intensities equal to or larger than the predetermined threshold, wherein the predetermined threshold is set according to a beam diameter of the observation light incident on the light-receiving surface.