| 摘要 |
The present technique relates to a semiconductor device and an operating method thereof. The semiconductor device includes memory blocks which include main data storage parts and cycling information storage parts; a circuit group which is configured to perform the wear leveling operation of the memory blocks; and a control circuit which sets a threshold value according to the cycling information and performs the wear leveling operation according to the set threshold value. So, the wear level of the memory block can be efficiently managed. |
