发明名称 |
PROCEDE DE FABRICATION D'UN TRANSISTOR |
摘要 |
The method involves forming an initial insulating layer (114) on both sides of a stack of grid of cavities (440) by etching an active layer. A continuous insulating layer (118) is formed by forming an insulating film on exposed surfaces of an initial substrate (112) such that the film forms a continuous insulating layer of the cavities with the first insulating layer. Side ends of a channel (180) formed by a portion of the active layer is exposed, and the cavities are filled by a semiconductor material through epitaxy from the side ends to form a source and the drain. |
申请公布号 |
FR3002079(B1) |
申请公布日期 |
2016.09.09 |
申请号 |
FR20130051140 |
申请日期 |
2013.02.11 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES;STMICROELECTRONICS (CROLLES 2) SAS;STMICROELECTRONICS SA |
发明人 |
NIEBOJEWSKI HEIMANU;MORAND YVES;VINET MAUD |
分类号 |
H01L21/336;H01L21/76;H01L29/772 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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