发明名称 PROCEDE DE FABRICATION D'UN TRANSISTOR
摘要 The method involves forming an initial insulating layer (114) on both sides of a stack of grid of cavities (440) by etching an active layer. A continuous insulating layer (118) is formed by forming an insulating film on exposed surfaces of an initial substrate (112) such that the film forms a continuous insulating layer of the cavities with the first insulating layer. Side ends of a channel (180) formed by a portion of the active layer is exposed, and the cavities are filled by a semiconductor material through epitaxy from the side ends to form a source and the drain.
申请公布号 FR3002079(B1) 申请公布日期 2016.09.09
申请号 FR20130051140 申请日期 2013.02.11
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES;STMICROELECTRONICS (CROLLES 2) SAS;STMICROELECTRONICS SA 发明人 NIEBOJEWSKI HEIMANU;MORAND YVES;VINET MAUD
分类号 H01L21/336;H01L21/76;H01L29/772 主分类号 H01L21/336
代理机构 代理人
主权项
地址