发明名称 APPARATUS FOR MEASURING PARAMETERS OF AN ELECTRONIC DEVICE
摘要 <p>A first terminal (791) of a device-under-measurement (DUM) is connected to a buffer amplifier (758) and to the inverting input (747) of an operational amplifier (754). A second terminal (792) of the DUM is connected to a buffer amplifier (756) having its output (796) connected to the non-inverting input (746) of the operational amplifier (754). The non-inverting input is also connected to the output (793) of a signal generator (760). The second terminal (792) is also connected to ground (767) through a programmable load circuit (762). A circuit (779) creates a feedback loop from the DUM and the load circuit (762) to the operational amplifier (754) to enable the amplifier to maintain a predetermined voltage across the DUM and to isolate the amplifier from current flow from the load circuit (762). An oscilloscope (766) is connected across the outputs (727, 796) of the buffer amplifiers (758, 757) and a computer (764) controls the signal generator (760) in response to a signal from the oscilloscope and also controls the load (762) via a load control circuit (765).</p>
申请公布号 WO1997034156(A1) 申请公布日期 1997.09.18
申请号 US1997004568 申请日期 1997.03.17
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