发明名称 Method and apparatus for detecting and analyzing the propagation of noise through an integrated circuit
摘要 One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.
申请公布号 US7263676(B2) 申请公布日期 2007.08.28
申请号 US20030410919 申请日期 2003.04.09
申请人 SYNOPSYS, INC. 发明人 GYURE ALEXANDER;ZEJDA JINDRICH;FALLAH-TEHRANI PEIVAND;WANG WENYUAN;LO CHI-CHONG;KASNAVI SEYED ALIREZA;SHAHRAM MAHMOUD;LUO YANSHENG;SHU WILLIAM CHIU-TING
分类号 G06F17/50;G06F9/45 主分类号 G06F17/50
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