发明名称 |
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor structure which improves the performance of a back side illuminated (BSI) image sensor device as well as reduces the cost and time on processing the BSI image sensor, and to provide a manufacturing method of the semiconductor structure.SOLUTION: A semiconductor structure 100 includes: a semiconductive substrate 101 including a first side 101a and a second side 101b opposite to the first side; a radiation sensing device 101c disposed on the semiconductive substrate; an interlayer dielectric (ILD) 102 disposed over the first side of the semiconductive substrate; and a conductive pad 103 disposed in the semiconductive substrate, passing through the ILD, and configured to couple to an interconnect structure 104a disposed over the ILD. A portion of the conductive pad is surrounded by the semiconductive substrate, and a step height T2 is formed by a surface 103a of the portion of the conductive pad and the second side of the semiconductive substrate.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016129216(A) |
申请公布日期 |
2016.07.14 |
申请号 |
JP20150190312 |
申请日期 |
2015.09.28 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTUARING CO LTD |
发明人 |
WEI CHIA-YU;HSIAO CHIN-HSUN;CHU YI-HSING;LIN YEN-LIANG;CHIN SHINKICHI;HSU YUNG-LUNG |
分类号 |
H01L27/14;H01L21/3205;H01L21/768;H01L23/522 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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