发明名称 System and method for inspection of components
摘要 An automatic portable inspection system includes a part holder for holding a component to be inspected and a rotary actuator coupled to the part holder. The system further includes an eddy current probe for scanning the component and providing eddy current signals. The system also includes a self-alignment unit coupled to the eddy current probe and configured to align an axis of the probe substantially perpendicular to a surface of the component and to maintain constant contact with said surface of the component. The system also includes a linear actuator coupled to the self-alignment unit, for providing movement of the eddy current probe along the X, Y and Z axes. A motion control unit is coupled to the rotary actuator and the linear actuator, for controlling the rotary actuator and the linear actuator for moving said probe about the component in accordance with a scan plan.
申请公布号 US9435766(B2) 申请公布日期 2016.09.06
申请号 US201314097829 申请日期 2013.12.05
申请人 General Electric Company 发明人 Plotnikov Yuri Alexeyevich;Noonan Daniel John;McLeod, Jr. John Edward;Andolfi Alessio;Catastini Riccardo
分类号 G01N27/82;G01N27/90;G01B21/04 主分类号 G01N27/82
代理机构 代理人 Caruso Andrew J.
主权项 1. An automatic portable inspection system, comprising: a part holder for holding a component to be inspected; a rotary actuator coupled to the part holder, wherein said rotary actuator provides rotation of the component; an eddy current probe for scanning the component and providing a plurality of eddy current signals; a self-alignment unit comprising a casing for the eddy current probe, a plurality of pins extending from the casing to a surface of the component, and a spring disposed between the casing and one end of the eddy current probe, wherein another end of the probe engages the surface of the component, wherein the self-alignment unit is coupled to the eddy current probe, wherein said self-alignment unit is configured to align an axis of the eddy current probe substantially perpendicular to a surface of the component and to maintain constant contact with said surface of the component during scanning; a linear actuator coupled to the self-alignment unit, wherein the linear actuator provides movement of the eddy current probe along the X, Y and Z axes; and a motion control unit coupled to the rotary actuator and the linear actuator, wherein said motion control unit controls the rotary actuator and the linear actuator for moving said eddy current probe about the component in accordance with a scan plan.
地址 Niskayuna NY US