发明名称 TEMPERATURE MEASUREMENT APPARATUS AND TEMPERATURE MEASUREMENT METHOD
摘要 A temperature measurement apparatus includes a first temperature sensor disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body, and a second temperature sensor disposed so as to be close to a display unit in the thickness direction of the apparatus main body. The display unit is switched between a first display state and a second display state by switching a mark between display and non-display. An internal temperature of the object to be measured is calculated by using a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the first display state, and a detected temperature in the first temperature sensor and a detected temperature in the second temperature sensor in the second display state.
申请公布号 US2016258823(A1) 申请公布日期 2016.09.08
申请号 US201615061334 申请日期 2016.03.04
申请人 SEIKO EPSON CORPORATION 发明人 SHIMIZU Sakiko;IKEDA Akira
分类号 G01K13/00;G01K1/02 主分类号 G01K13/00
代理机构 代理人
主权项 1. A temperature measurement apparatus comprising: a display unit; a first temperature sensor that is disposed so as to be close to a contact surface with an object to be measured in a thickness direction of an apparatus main body; a second temperature sensor that is disposed so as to be close to the display unit in the thickness direction of the apparatus main body; and a calculation processing unit that calculates an internal temperature of the object to be measured by using a first state first temperature detected by the first temperature sensor and a first state second temperature detected by the second temperature sensor when the display unit is in a first display state, and a second state first temperature detected by the first temperature sensor and a second state second temperature detected by the second temperature sensor when the display unit is in a second display state.
地址 Tokyo JP