| 摘要 |
PURPOSE: DC test apparatus having a probe card division guide is provided to prevent a damage of the probe card by easily separating a probe card from one end of an inner ring, and reduces a fatigue of a working man by forming a divided guide in an inner ring one end. CONSTITUTION: Inner ring(11) is formed to be a donut shape. Many pin holes(12) are circularly formed along an edge of the inner ring(11). Many projection pins correspond to the pin holes(12) of the inner ring(11). The probe card includes the inner ring, the pin holes, and the projection pins. When the probe card is separated/connected from/to the inner ring, a divided guide(13) is formed on one end of a circumference of the inner ring, thereby the working man easily mounts/or connects the probe card. Thereby, the DC test apparatus having a probe card division guide prevents a damage of the probe card by easily separating a probe card from one end of an inner ring, and reduces a fatigue of a working man by forming a divided guide in an inner ring one end.
|
