| 摘要 |
<p>A method of measuring grid error in an optical device is described. A plurality of optical channels at different frequencies are incident on a photodiode array comprising a plurality of photodiodes each operable to convert light energy incident thereon to an electrical value representative of the intensity of the incident light. The location of channel peaks in the photodiode array is determined from the electrical value to generate a set of real data. A line of best fit is generated from the real data and the channel peak locations according to a predetermined algorithm, the line of best fit fitting the optical channels to the photodiode array to obtain a set of estimated data. The estimated data is compared with the real data to provide an indicator of grid error.</p> |
