发明名称 Semiconductor integrated circuit and testing method of same
摘要 A program circuit activates a pass signal when a first program unit is programmed. The first program unit is programmed when a test of an internal circuit is passed. A mode setting circuit switches an operation mode to a normal operation mode or a test mode by external control. A state machine allows a partial circuit of the internal circuit to perform an unusual operation different from a normal operation when the pass signal is inactivated during the normal operation mode. By recognizing the unusual operation during the normal operation mode, it can be easily recognized that a semiconductor integrated circuit is bad. Since a failure can be recognized without shifting to the test mode, for example, a user who purchases the semiconductor integrated circuit can also easily recognize the failure.
申请公布号 US2008048703(A1) 申请公布日期 2008.02.28
申请号 US20070892357 申请日期 2007.08.22
申请人 FUJITSU LIMITED 发明人 YAMAGUCHI KOTA
分类号 G01R31/26;G01R31/28;G11C29/44;H01L21/66 主分类号 G01R31/26
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