| 摘要 |
<p>Operation of a delay circuit is switched by a signal for selecting normal operation and test operation, and when operation of the delay circuit is switched to the normal operation, a signal is transmitted to a normal operation output with a time lag set by a normal operation input. When operation of the delay circuit is switched to the test operation, a test operation loop is formed by inverting the output of the delay circuit and an oscillation waveform dependent on the time lag is outputted. The output is counted by a counting circuit as the number dependent on the time lag.</p> |
