| 摘要 |
PROBLEM TO BE SOLVED: To provide a development support device improving debugging efficiency of a program by improving usability of a user, and to provide a semiconductor test device having the device. SOLUTION: This development support device is a device for performing development support of the test program used in the semiconductor test device, for example, and includes: a test program debugger 21 allowing setting of variable display points S1-S3 each displaying contents of a variable included in the test program according to an instruction of the user; an arrangement variable display tool 22 for displaying the contents of the variable obtained by execution of the test program; a test program process 20 for controlling execution of the test program according to relation between the set variable display points S1-S3 and an execution position of the test program; and an interface part 23 for instructing the variable to be displayed on the arrangement variable display tool 22 in reference to the set contents by the test program debugger 21 according to a control situation of the test program process 20. COPYRIGHT: (C)2009,JPO&INPIT
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