发明名称 SCANNING PROBE MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To fix surely a sample in liquid, relative to a scanning probe microscope. SOLUTION: In this scanning probe microscope, a probe 3 and a sample 5 are arranged close oppositely in liquid in a sample chamber 9', and a relative position between the probe 3 and the sample 5 is changed, and image information of a sample surface is acquired based on interaction between the probe 3 and the sample 5. In the microscope, a plate 20 on which holes 21A, 21B, 21C, etc., are bored is installed in the sample chamber 9' so that the inside of the sample chamber 9' is divided in two, upper and lower parts, by the plate 20. The sample 5 is set on the upper surface of the plate 20 so as to close the holes 21A, 21B, 21C, etc., so that liquid flows along the upper surface and the lower surface of the plate 20 respectively, and that a flow rate of liquid flowing along the lower surface of the plate 20 is higher than a flow rate of liquid flowing along the upper surface. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009133721(A) 申请公布日期 2009.06.18
申请号 JP20070310108 申请日期 2007.11.30
申请人 JEOL LTD 发明人 KOJIMA HIDEO
分类号 G01Q30/14;G01Q60/24 主分类号 G01Q30/14
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