发明名称 |
METHOD FOR MANUFACTURING PHOTO MASK HAVING PHASE SHIFT LAYER |
摘要 |
PURPOSE: A method for manufacturing a photo mask having a phase shift layer is provided to be capable of preventing the damage of a predetermined surface and simplifying the manufacturing process. CONSTITUTION: A phase shift layer(33) and a light shielding pattern(40) are sequentially formed on a transparent substrate(31). A resist thin film is formed on the resultant structure. At this time, a phase shift process is capable of being applied to the resist thin film. The resist thin film is transformed into a resist pattern(45) by sequentially carrying out the first exposure, a bake process, the second exposure, and a development on the resultant structure. A phase shift pattern is formed by selectively etching the phase shift layer using the resist pattern as an etching mask.
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申请公布号 |
KR100298609(B1) |
申请公布日期 |
2001.06.01 |
申请号 |
KR19930014609 |
申请日期 |
1993.07.29 |
申请人 |
DAI NIPPON PRINTING CO., LTD. |
发明人 |
FUJITA HIROSHI;KURIHARA MASAAKI |
分类号 |
H01L21/027;G03F1/00;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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