发明名称 METHOD FOR MANUFACTURING PHOTO MASK HAVING PHASE SHIFT LAYER
摘要 PURPOSE: A method for manufacturing a photo mask having a phase shift layer is provided to be capable of preventing the damage of a predetermined surface and simplifying the manufacturing process. CONSTITUTION: A phase shift layer(33) and a light shielding pattern(40) are sequentially formed on a transparent substrate(31). A resist thin film is formed on the resultant structure. At this time, a phase shift process is capable of being applied to the resist thin film. The resist thin film is transformed into a resist pattern(45) by sequentially carrying out the first exposure, a bake process, the second exposure, and a development on the resultant structure. A phase shift pattern is formed by selectively etching the phase shift layer using the resist pattern as an etching mask.
申请公布号 KR100298609(B1) 申请公布日期 2001.06.01
申请号 KR19930014609 申请日期 1993.07.29
申请人 DAI NIPPON PRINTING CO., LTD. 发明人 FUJITA HIROSHI;KURIHARA MASAAKI
分类号 H01L21/027;G03F1/00;(IPC1-7):H01L21/027 主分类号 H01L21/027
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