发明名称 Semiconductor device fabrication
摘要 A trench is formed in a semiconductor substrate using a mask. The trench is filled with electrode material, a part of which is removed; alternatively, the trench is partially filled with the electrode material. The side walls of the trench are doped with the mask still in place. After the side walls are doped, the remainder of the trench is filled. The result is a trench gated power device such as a MOSFET, MESFET or IGBT.
申请公布号 AU6232296(A) 申请公布日期 1997.01.15
申请号 AU19960062322 申请日期 1996.06.14
申请人 JONATHAN LESLIE EVANS 发明人 JONATHAN LESLIE EVANS
分类号 H01L21/265;H01L21/331;H01L21/336;H01L29/08;H01L29/423;H01L29/739;H01L29/78 主分类号 H01L21/265
代理机构 代理人
主权项
地址