发明名称 ELECTROSTATIC CHUCK AND WAFER STAGE
摘要 <p>PROBLEM TO BE SOLVED: To change the temperature of a wafer in short time without affecting throughput by providing a dielectric made of an insulating material, an electrode made of a conductor below the dielectric and a heater for heating the dielectric below the electrode. SOLUTION: The electrostatic chuck 3 is constituted of the dielectric 4 made of the insulating material, the electrode 5 made of the conductor provided on the lower face of the dielectric and the heater 6 provided below the electrode 5. An insulating body 7 which is almost columnar is provided between the electrode 5 and the heater 6. The dielectric 4 is made of the insulating material of high heat conductivity and the material of the electrode 5 is not especially restricted if it is made of the conductor of metal or alloy. The heater 6 is formed by alloy constituted of Fe, Cr and Al, for example. Thus, heat by means of heating by heater 6 is speedily transmitted to the dielectric through the electrode 5, and switching from a low temperature to a high temperature can be executed in short time.</p>
申请公布号 JPH09260474(A) 申请公布日期 1997.10.03
申请号 JP19960065625 申请日期 1996.03.22
申请人 SONY CORP;SOUZOU KAGAKU:KK 发明人 KADOMURA SHINGO;SHIROSAKI TOMOHIDE;HIRANO SHINSUKE;MIYASHITA KINYA;MIYATA SEIICHIRO;TATSUMI YOSHIAKI
分类号 B23Q3/15;H01L21/00;H01L21/302;H01L21/3065;H01L21/683;H02N13/00;(IPC1-7):H01L21/68;H01L21/306 主分类号 B23Q3/15
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