| 摘要 |
PROBLEM TO BE SOLVED: To provide a noise detection circuit capable of easily judging whether the occurrence of error during the operation of a semiconductor integrated circuit is caused by the failure due to circuit operation in the semiconductor integrated circuit on the noise from the outside of the semiconductor integrated circuit. SOLUTION: The noise detection circuit consists of a delay circuit 11 connected to an input terminal, first and second edge detection circuits 12 and 14 to be operated by an input signal and a delay output signal, an AND/OR circuit 13, a first flip-flop circuit 15 to be set and reset by the output of the circuit 12 and the circuit 13, a second flip/flop circuit 16 for receiving the output off this circuit 15 and the output of the circuit 14, and an output terminal 17 connected to the output of the circuit 16. Thus, noise whose width is smaller than the delay time of the circuit 11 is detected. |
