| 摘要 |
PROBLEM TO BE SOLVED: To ensure turning-on of only one select line of a multiplexer during a logic built-in self test. SOLUTION: A device, obtaining an effective value during logic built-in self test(LBIST), includes a first multiplexer 111, a second multiplexer 115, and a 1 hot 'init' circuit 113. The 1 hot 'init' circuit 113 includes a scan register, a first inverter, a third multiplexer, a second inverter, and a fourth multiplexer. The scan register includes a plurality of state elements. The first multiplexer 111 is connected, so as to receive a random data signal and an output of the 1 hot init circuit 113. The second state element from the last and the last state element of the scan register are connected to the inverter and the third and fourth multiplexers, respectively, in the 1 hot init circuit 113.
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