发明名称 STRUCTURE INSPECTION DEVICE AND STRUCTURE INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a structure inspection device and a structure inspection method capable of inspecting a wide area of a back side of a structure without imposing traffic control.SOLUTION: A structure inspection device comprises: an inter-main-girder member; a supporting unit; a lateral-direction rail; a lateral-direction sliding body; and imaging means. The structure inspection device can move the lateral-direction sliding body along the lateral-direction rail and capture an image of a back side of a structure with the imaging means on the lateral-direction sliding body while the same is moving. A structure inspection method uses an inspection device which has a permanent passage, the supporting unit, the lateral-direction rail, the lateral-direction sliding body and the imaging means. The structure inspection method can inspect the structure by: moving the lateral-direction sliding body along the lateral-direction rail; capturing the image of the back side of the structure with the imaging means while the same is moving; and confirming the captured image.SELECTED DRAWING: Figure 1
申请公布号 JP2016151129(A) 申请公布日期 2016.08.22
申请号 JP20150028854 申请日期 2015.02.17
申请人 YOKOGAWA BRIDGE CORP 发明人 YANAKA AKIHISA;YAMAMOTO HIROSHI;MIKI EIJI
分类号 E01D22/00 主分类号 E01D22/00
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