| 摘要 |
<p>PURPOSE:To find a wire disconnection failure in a short time through a direct current characteristic screening by a method wherein a source lead-out electrode is divided into two or more pieces, and the divided source electrodes are electrically insulated from each other. CONSTITUTION:A semiconductor element case is provided with a ceramic 3, source lead-out electrodes 15 and 16 formed of gold film on the ceramic 3, a gate lead-out electrode 7, and a drain lead-out electrode 9, where a source lead-out electrode is divided into two or more pieces and the divided electrodes 15 and 16 are electrically insulated from each other. As mentioned above, a source lead-out electrode metallized on the ceramic of a semiconductor element case is divided into two or more pieces, so that when a wire is disconnected by a sealing brazing material, it can be found through a direct current characteristic screening.</p> |
