发明名称 |
Rough dielectric film by etchback of residue |
摘要 |
A capacitor and method of forming the capacitor for high density applications. The capacitor (100) comprises a storage node (106) having peaks (108) formed on a surface thereof. The peaks (108) are created by forming a photoresist residue layer (130) on the polysilicon layer of the storage node (108). The structure is then dry etched using the residue layer (130) as a mask to create peaks (108).
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申请公布号 |
US5753420(A) |
申请公布日期 |
1998.05.19 |
申请号 |
US19960713338 |
申请日期 |
1996.09.13 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MISIUM, GEORGE R. |
分类号 |
H01L27/04;G03F7/00;G03F7/09;G03F7/16;G03F7/26;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):G03F7/00 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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