发明名称 Rough dielectric film by etchback of residue
摘要 A capacitor and method of forming the capacitor for high density applications. The capacitor (100) comprises a storage node (106) having peaks (108) formed on a surface thereof. The peaks (108) are created by forming a photoresist residue layer (130) on the polysilicon layer of the storage node (108). The structure is then dry etched using the residue layer (130) as a mask to create peaks (108).
申请公布号 US5753420(A) 申请公布日期 1998.05.19
申请号 US19960713338 申请日期 1996.09.13
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MISIUM, GEORGE R.
分类号 H01L27/04;G03F7/00;G03F7/09;G03F7/16;G03F7/26;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):G03F7/00 主分类号 H01L27/04
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