发明名称 PLASMA ENHANCED CVD SYSTEM AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To provide a plasma enhanced CVD system which can shorten the time required for hydrogenating the polycrystalline silicon of a thin film transistor(TFT) and forming a transparent film on the TFT. SOLUTION: This plasma enhanced CVD system is provided with a first fixed capacitor (1) for high-frequency power matching, a second fixed capacitor (2) for high-frequency power matching wired in parallel with the capacitor (1), and a switching means (4) which selectively switches the capacitors (1) and (2) for using either one or both of the capacitors (1) and (2).
申请公布号 JP2001230207(A) 申请公布日期 2001.08.24
申请号 JP20000036452 申请日期 2000.02.15
申请人 MITSUBISHI ELECTRIC CORP;SEIKO EPSON CORP 发明人 TAKANABE SHOICHI;ISHIGURO HIDETO
分类号 H01L21/205;C23C16/505;H05H1/46 主分类号 H01L21/205
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