发明名称 |
PLASMA ENHANCED CVD SYSTEM AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma enhanced CVD system which can shorten the time required for hydrogenating the polycrystalline silicon of a thin film transistor(TFT) and forming a transparent film on the TFT. SOLUTION: This plasma enhanced CVD system is provided with a first fixed capacitor (1) for high-frequency power matching, a second fixed capacitor (2) for high-frequency power matching wired in parallel with the capacitor (1), and a switching means (4) which selectively switches the capacitors (1) and (2) for using either one or both of the capacitors (1) and (2). |
申请公布号 |
JP2001230207(A) |
申请公布日期 |
2001.08.24 |
申请号 |
JP20000036452 |
申请日期 |
2000.02.15 |
申请人 |
MITSUBISHI ELECTRIC CORP;SEIKO EPSON CORP |
发明人 |
TAKANABE SHOICHI;ISHIGURO HIDETO |
分类号 |
H01L21/205;C23C16/505;H05H1/46 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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