| 摘要 |
PROBLEM TO BE SOLVED: To provide an LSI testing circuit individually testing a test object terminal and easily specifying a soldering defective place without being affected by the logics of the terminals other than the test object terminal. SOLUTION: This LSI testing circuit is provided with a timing signal generation section 102 generating a frame signal indicating the top bit of an inputted/ outputted serial signal and an address signal indicating the n-th bit of the serial signal, a test signal generation section 103 extracting the n-th bit indicated by the address signal from the serial signal and generating an output test signal testing the output terminal of an LSI corresponding to the address signal, a selector 125 selectively outputting the output test signal from the test signal generation section or an LSI normal output signal according to a test mode signal, and a data conversion section 104 outputting the signal inputted from the input terminal corresponding to the address signal at the n-th bit of the serial signal. The input terminal specified by the address signal is individually tested.
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