发明名称 |
ALIGNER, METHOD OF MANUFACTURING ALIGNER AND METHOD OF MANUFACTURING MICRO-DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide an aligner which can measure an amount of light applied on a photosensitive substrate through a projection optical system rapidly and accurately and can adjust a light amount highly precisely and rapidly based on the measurement result even after the aligner is manufactured, and a manufacturing method of the same. SOLUTION: A space image measurement device 24 for measuring an amount of light applied on a plate P through each of projection optical system units PL1 and PL5 constituting a projection optical system PL and a dimming filter 7 for dimming light from a light source 1 during measurement using the space image measurement device 24 are provided. Dimming filters 13b to 13f and variable dimming filters 14b to 14f for adjusting a dispersion in the amount of light via each of the projection optical system units PL1 to PL5 are provided between each of projection ends 11b to 11f of a light guide 11 and a mask M. |
申请公布号 |
JP2002329651(A) |
申请公布日期 |
2002.11.15 |
申请号 |
JP20010133048 |
申请日期 |
2001.04.27 |
申请人 |
NIKON CORP |
发明人 |
KOYAMA MOTOO;KATO MASANORI |
分类号 |
G03F7/20;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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