发明名称 METHOD FOR MANUFACTURING PHOTOMASK AND PHOTOMASK DRAWING SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing photomask and a photomask drawing system by which process time for a photomask can be decreased and the cost can be reduced while the accuracy required for various patterns to be formed on the photomask is maintained. <P>SOLUTION: First and second drawing data 7, 8a, 8b are formed by figure operation of design data. A first pattern is formed in a first region on the photomask according to the first drawing data 7 by using a first photomask drawing apparatus. The a second pattern is formed in a second region on the photomask according to the second drawing data 8a, 8b by using a second photomask drawing apparatus having the processing accuracy different from the processing accuracy of the first photomask drawing apparatus. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004361507(A) 申请公布日期 2004.12.24
申请号 JP20030156999 申请日期 2003.06.02
申请人 RENESAS TECHNOLOGY CORP 发明人 KAMON KAZUYA
分类号 G03F1/68;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/68
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