发明名称 Thin film transistor array panel with improved connection to test lines
摘要 A thin film transistor (TFT) array panel with improved contact between the display signal lines and test lines is presented. The TFT array panel includes: gate lines and data lines intersecting each other, switching elements connected to the gate lines and the data lines, and at least one test line disposed near end portions of the gate lines or the data lines. An insulating layer covers the gate lines, the data lines and the switching elements and has first contact holes exposing the end portions of the gate lines or the data lines and second contact holes exposing the test lines. Auxiliary test lines are formed on the insulating layer and commonly connected to conductive layers, wherein the conductive layers connect at least one test line to the gate lines or the data lines via the first and the second contact holes.
申请公布号 US2006284633(A1) 申请公布日期 2006.12.21
申请号 US20050268877 申请日期 2005.11.07
申请人 PARK JUNG-WOO 发明人 PARK JUNG-WOO
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址