发明名称 Method of forming a semiconductor device
摘要 A sidewall spacer structure is formed adjacent to a gate structure whereby a material forming an outer surface of the sidewall spacer structure contains nitrogen. Subsequent to its formation the sidewall spacer structure is annealed to harden the sidewall spacer structure from a subsequent cleaning process. An epitaxial layer is formed subsequent to the cleaning process.
申请公布号 US7402485(B1) 申请公布日期 2008.07.22
申请号 US20050229864 申请日期 2005.09.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 EN WILLIAM G.;KAMMLER THORSTEN;PATON ERIC N.;LUNING SCOTT D.
分类号 H01L21/8238 主分类号 H01L21/8238
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