发明名称 PHOTO-ELECTRON APPARATUS
摘要 PROBLEM TO BE SOLVED: To solve problems such as the output signal wavelength of a semiconductor laser being a light source can not be controlled with high precision, and wavelengths mix in the worst case caused by shifting of the output signal wavelength and so on, when it is used in a WDM system where wavelengths are multiplexed with high density, since time is lost until control of a Peltier element is performed after the sensing of temperature by a thermistor, in the case of an optical semiconductor device module where a Peltier element is controlled on the basis of a temperature sensed by a thermistor. SOLUTION: A strain sensor is fitted to a heat sink portion in the vicinity of a semiconductor laser, and a control circuit composed of a comparator circuit which performs comparison and decision of a sensed quantity of strain of a heat sink, and a Peltier operating circuit which controls and operates a Peltier element is arranged.
申请公布号 JP2001244553(A) 申请公布日期 2001.09.07
申请号 JP20000049231 申请日期 2000.02.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 TAKANO JIHEI
分类号 H01S5/068;H01S5/022;H01S5/024;H04B10/07;H04B10/293;H04B10/564;H04B10/572 主分类号 H01S5/068
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