发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To improve a yield of a semiconductor device that comprises a ferroelectric capacitor and in a method of manufacturing the same.SOLUTION: A method of manufacturing a semiconductor device includes the steps of: forming an insulating film 15 above a semiconductor substrate 1; forming a conductive film 19 on the insulating film 15; forming a dielectric film 20a on the conductive film 19; forming a plurality of upper electrodes 21a on the dielectric film 20a; forming a first protective insulating film 28 on the upper electrode 21a and the dielectric film 20a by a sputtering method; forming a second protective insulating film 31 on the first protective insulating film 28 by an atom layer deposition method to fill a gap S at a crystal grain boundary of the dielectric film 20a by the second protective insulating film 31; and patterning the conductive film 19 to form a lower electrode 19a after forming the second protective insulating film 31.SELECTED DRAWING: Figure 26 |
申请公布号 |
JP2016134518(A) |
申请公布日期 |
2016.07.25 |
申请号 |
JP20150008640 |
申请日期 |
2015.01.20 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
OKITA YOICHI;ITO HIDEKI;O FUMIO |
分类号 |
H01L21/8246;H01L21/316;H01L27/105 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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