Testing device for assemblies in digital electric circuit - with assembly put on adaptor circuit connected to digital and analogue testing devices

摘要

The assemblies are connected by their inputs and outputs through a plug-in connector with blade and spring contacts. Signal processing is in parallel. An adapter circuit (ADS) with a double plug-in device (MLP, FLP) is connected by its input and output terminals through connecting wires (DL1-DLm). It can be inserted without interruption in series into the signal path of the tested assembly (BG) put on the adapter circuit (ADS). Secondary wires (NL1-NLm) are branched off from the through wires and are connected to a selector circuit (ASW) in which a selectable number of secondary wires can be switched through. These wires lead to a digital testing device (DAG), and/or through a digital-analogue convertor (DAW) to an analogue testing device (DAA).