发明名称 Multi-sample particle analysis apparatus and method
摘要 A suction chamber and at least one sample chamber are located in relatively shiftable operating adjacency. The suction chamber may have a plurality of orifices and the sample chamber a single port for selective registration with the orifices. On the other hand, the suction chamber may have a port or an orifice, and a plurality of sample chambers may have either respective ports or orifices, and the chambers mounted for relative shifting for effecting selective port/orifice registration. A sample depletion detector may be provided in association with the sample chamber. The sample chamber may have a minimum volume residual sample well for maintaining a filled system with the suction chamber to facilitate recurrent sample analyzing function.
申请公布号 US4471297(A) 申请公布日期 1984.09.11
申请号 US19820424457 申请日期 1982.09.27
申请人 PARTICLE DATA, INC. 发明人 BERG, ROBERT H.
分类号 G01N15/12;(IPC1-7):G01N27/00 主分类号 G01N15/12
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