Testing sensor signal processors

摘要

A signal processor which applies non-linear dynamic compensation to an applied analog signal is tested by applying to a reference ramp signal compensation having a transfer function equal to the inverse of the transfer function of the signal processor. This test signal is applied to the signal processor in place of the sensor signal so that after the compensation of the processor is applied to it, the resultant signal should match the reference signal. When the signal processing is carried out digitally in a microcomputer and the response to the test signal is multiplexed back to the tester along with response signals from other microcomputers, variable time skewing of the returned test signal is eliminated by feeding the reference signal through a processing path parallel to that of the test signal and then comparing those two signals in the tester. The reference signal is also used in the microcomputer to continually generate a dummy actuation signal which provides a continuous check on microcomputer operation.